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| | Abstract | | This paper deals with comparison between methods of diffraction summation and Stolt migration. The level of artifacts introduced by Stolt migration substantially less, than the level of artifacts introduced by method of diffraction summation. The Stolt migration method implemented faster than the method of diffraction summations due to algorithm of fast Fourier transform. The main limitation of Stolt migration consists in the fact that a velocity of wave propagation in a medium is constant. Stolt migration can apply to common midpoint stacked section. Diffraction summation method is more universal method. It can takes into account variable-velocity case and bistatic schema of gathering data. |
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