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| | Abstract | | The CRS is an alternative stacking method that offers improved signal to noise ratio of data significantly by stacking seismic traces over offset-midpoint surfaces. This technology has been successfully applied to improve noisy data from complex structures because the method treats dip and curvature of reflection surface. However, CRS processing is quite different from that of conventional method and some sort of quality control method should be established. Consequently, we plan to discuss CRS processing issues over a series of papers. In this paper, we seek issues in the parameter analysis and moveout correction of CRS method and then show our practical solutions for the problems adopted in our multi-dip reflection surfaces or MDRS method. |
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