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| | Abstract | | We introduce a CRS method treating conflicting dipping events, which is called the multi-dip reflection surfaces or MDRS method. In the method, first, several events at a point are extracted with different sets of CRS parameters, respectively. Second, reflections are sifted by sorting with respect to their semblance values and superimposed together to get a MDRS stack section. This method offers a higher fidelity of wavefield representation, as well as maintaining the advantage on high S/N ratio of the conventional CRS method. |
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